TLK10031 Datasheet, PDF (105/146 Pages) Texas Instruments – TLK10031 Single-Channel XAUI/10GBASE-KR Transceiver

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TLK10031
SLLSEL3A – JULY 2015 – REVISED AUGUST 2015
7.5.3.25 KR_VS_TP_GEN_CONTROL (register =0x8002) (default = 0x0000)
(device address: 0x01)
Figure 7-112. KR_VS_TP_GEN_CONTROL Register
15
14
13
12
11
10
9
8
RESERVED
RW
7
6
RESERVED
5
4
RX_TPG_HLM_TEST_SEL[1:0]
(R)
RW
RW
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
3
RX_TPG_CRP
AT_TEST_EN
(R)
RW
2
1
RX_TPG_CJPA RX_TPG_10GF
T_TEST_EN C_TEST_EN
(R)
(R)
RW
RW
0
RX_TPG_HLM
_TEST_EN
(R)
RW
Table 7-94. KR_VS_TP_GEN_CONTROL Field Descriptions
Bit Name
15:6 RESERVED
5:4 RX_TPG_HLM_TEST_SEL[1:0]
(R)
3 RX_TPG_CRPAT_TEST_EN
(R)
2 RX_TPG_CJPAT_TEST_EN
(R)
1 RX_TPG_10GFC_TEST_EN
(R)
0 RX_TPG_HLM_TEST_EN
(R)
Type
RW
RW
RW
RW
RW
Reset
Description
For TI use only. Always reads 0.
XAUI based test pattern selection on LS side. See Test pattern procedures for more
information.
00 = High Frequency test pattern(Default 2’b00)
01 = Low Frequency test pattern
10 = Mixed Frequency test pattern
11 = Normal operation
XAUI based test pattern selection on LS side. See Test pattern procedures for more
information.
0 = Normal operation. (Default 1’b0)
1 = Enables CRPAT test pattern generation
XAUI based test pattern selection on LS side. See Test pattern procedures for more
information.
0 = Normal operation. (Default 1’b0)
1 = Enables CJPAT test pattern generation
XAUI based test pattern selection on LS side. See Test pattern procedures for more
information.
0 = Normal operation. (Default 1’b0)
1 = Enables 10 GFC CJPAT test pattern generation
XAUI based test pattern selection on LS side. See Test pattern procedures for more
information.
0 = Normal operation. (Default 1’b0)
1 = Enables H/L/M test pattern generation
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