PIC18F23K22 Datasheet, PDF (431/492 Pages) Microchip Technology – 28/40/44-Pin, Low-Power, High-Performance Microcontrollers with nanoWatt XLP Technology

PIC18(L)F2X/4XK22
27.5 DC Characteristics: Primary Run Supply Current, PIC18(L)F2X/4XK22
PIC18LF2X/4XK22
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C  TA  +125°C
PIC18F2X/4XK22
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C  TA  +125°C
Param
No.
Device Characteristics
Typ Max Units
Conditions
D070
D071
Supply Current (IDD)^(1),(2)
0.07 0.14
0.12 0.25
mA -40°C to +125°C
mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
FOSC = 1 MHz
(PRI_RUN,
EC oscillator)
D072
D073
D074
0.08 0.20
0.13 0.25
0.15 0.30
mA -40°C to +125°C
mA -40°C to +125°C
mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
VDD = 5.0V
FOSC = 1 MHz
(PRI_RUN,
EC oscillator)
D075
D076
1.2 2.0 mA -40°C to +125°C VDD = 1.8V FOSC = 20 MHz
(PRI_RUN,
2.2 3.8 mA -40°C to +125°C VDD = 3.0V _{EC oscillator)}
D077
D078
D079
1.4 2.5 mA -40°C to +125°C VDD = 1.8V FOSC = 20 MHz
2.4 4.0 mA -40°C to +125°C VDD = 3.0V ^(PRI_RUN,
EC oscillator)
2.7 4.5 mA -40°C to +125°C VDD = 5.0V
D080
FOSC = 64 MHz
6.5 11 mA -40°C to +125°C VDD = 3.0V (PRI_RUN,
EC oscillator)
D081
D082
6.8 11 mA -40°C to +125°C VDD = 3.0V FOSC = 64 MHz
(PRI_RUN,
7.5 13 mA -40°C to +125°C VDD = 5.0V _{EC oscillator)}
D083
D084
1.0 1.7 mA -40°C to +125°C VDD = 1.8V FOSC = 4 MHz
16 MHz Internal
1.8 3.2 mA -40°C to +125°C VDD = 3.0V ^{(PRI_RUN, EC +}
PLL)
D085
D086
D087
1.0 1.8 mA -40°C to +125°C VDD = 1.8V FOSC = 4 MHz
1.9 3.5 mA -40°C to +125°C VDD = 3.0V ^{16 MHz Internal}
(PRI_RUN, EC +
2.2 4.0 mA -40°C to +125°C VDD = 5.0V _PLL)
D088
FOSC = 16 MHz
6.5
10
mA -40°C to +125°C
VDD = 3.0V
64 MHz Internal
(PRI_RUN, EC +
PLL)
Note 1:
2:
The supply current is mainly a function of operating voltage, frequency and mode. Other factors, such as
I/O pin loading and switching rate, oscillator type and circuit, internal code execution pattern and temper-
ature, also have an impact on the current consumption.
The test conditions for all IDD measurements in active operation mode are:
OSC1 = external square wave, from rail-to-rail; all I/O pins tri-stated, pulled to VDD;
MCLR = VDD; WDT enabled/disabled as specified.
The test conditions for all IDD measurements in active operation mode are:
All I/O pins set as outputs driven to VSS;
MCLR = VDD;
OSC1 = external square wave, from rail-to-rail (PRI_RUN and PRI-IDLE only).
 2010 Microchip Technology Inc.
Preliminary
DS41412B-page 431