PIC18F23K22 Datasheet, PDF (427/492 Pages) Microchip Technology – 28/40/44-Pin, Low-Power, High-Performance Microcontrollers with nanoWatt XLP Technology

PIC18(L)F2X/4XK22
27.3 DC Characteristics: RC Run Supply Current, PIC18(L)F2X/4XK22
PIC18LF2X/4XK22
Standard Operating Conditions (unless otherwise stated)
Operating temperature
-40°C  TA  +125°C
PIC18F2X/4XK22
Standard Operating Conditions (unless otherwise stated)
Operating temperature
-40°C  TA  +125°C
Param
No.
Device Characteristics
Typ Max Units
Conditions
D020
Supply Current (IDD)^(1),(2)
5.0
14 A
4.0
14 A
-40°C
+25°C
4.0
— A
+60°C
VDD = 1.8V
D021
4.5
18 A
7.0
30 A
8.0
20 A
7.0
20 A
+85°C
125°C
-40°C
+25°C
FOSC = 31 kHz
(RC_RUN mode,
LFINTOSC source)
7.0
— A
+60°C
VDD = 3.0V
7.5
22 A
+85°C
10.0 35 A
+125°C
D022
12
50 A
-40°C
15
50 A
17
50 A
+25°C
+85°C
VDD = 1.8V
20
60 A
+125°C
D023
16
50 A
19
50 A
23
50 A
25
60 A
-40°C
+25°C
+85°C
+125°C
VDD = 3.0V
FOSC = 31 kHz
(RC_RUN mode,
LFINTOSC source)
17
50 A
-40°C
D024
21
50 A
24
50 A
+25°C
+85°C
VDD = 5.0V
28
60 A
+125°C
D025
D026
0.12 0.25 mA -40°C to +125°C
0.15 0.30 mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
FOSC = 500 KHz
(RC_RUN mode,
MFINTOSC source)
D027
D028
D029
0.16 0.30 mA -40°C to +125°C
0.20 0.40 mA -40°C to +125°C
0.25 0.50 mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
VDD = 5.0V
FOSC = 500 KHz
(RC_RUN mode,
MFINTOSC source)
D030
D031
0.30 0.50 mA -40°C to +125°C
0.40 0.70 mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
FOSC = 1 MHz
(RC_RUN mode,
HFINTOSC source)
D032
D033
D034
0.35 0.60 mA -40°C to +125°C
0.45 0.80 mA -40°C to +125°C
0.55 0.90 mA -40°C to +125°C
VDD = 1.8V
VDD = 3.0V
VDD = 5.0V
FOSC = 1 MHz
(RC_RUN mode,
HFINTOSC source)
Note 1:
2:
The supply current is mainly a function of operating voltage, frequency and mode. Other factors, such as I/O pin
loading and switching rate, oscillator type and circuit, internal code execution pattern and temperature, also have an
impact on the current consumption.
Test condition: All Peripheral Module Control bits in PMD0, PMD1 and PMD2 set to ‘1’.
The test conditions for all IDD measurements in active operation mode are:
All I/O pins set as outputs driven to Vss;
MCLR = VDD;
OSC1 = external square wave, from rail-to-rail (PRI_RUN and PRI_IDLE only).
 2010 Microchip Technology Inc.
Preliminary
DS41412B-page 427