AMD-K6 Datasheet, PDF (132/346 Pages) Advanced Micro Devices – AMD-K6 Processor

AMD-K6^® Processor Data Sheet
Preliminary Information
20695H/0—March 1998
5.46
Summary
Sampled
TDI (Test Data Input)
Input, Internal Pullup
TDI is the serial test data and instruction input for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor samples TDI on every rising TCK edge but only
while in the Shift-IR and Shift-DR states.
5.47
TDO (Test Data Output)
Output
Summary
Driven and Floated
TDO is the serial test data and instruction output for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor drives TDO on every falling TCK edge but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
5.48
Summary
Sampled
TMS (Test Mode Select)
Input, Internal Pullup
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 205 for details
regarding the operation of the TAP controller.
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.
114
Signal Descriptions
Chapter 5