S9S12G128F0CLF Datasheet, PDF (1070/1158 Pages) Freescale Semiconductor, Inc – MC9S12G Family Reference Manual

Electrical Characteristics
Table A-1. Absolute Maximum Ratings¹
Num
Rating
Symbol
Min
1 I/O, regulator and analog supply voltage
2 Voltage difference V_DDX to V_DDA
3 Voltage difference V_SSX to V_SSA
4 Digital I/O input voltage
5 Analog reference
6 EXTAL, XTAL
7 Instantaneous maximum current
Single pin limit for all digital I/O pins²
V_DD35
∆_VDDX
∆_VSSX
V_IN
V_RH
V_ILV
I_D
8 Instantaneous maximum current
I_DL
Single pin limit for EXTAL, XTAL
9 Storage temperature range
Tstg
1 _{Beyond absolute maximum ratings device might be damaged.}
2 _{All digital I/O pins are internally clamped to VSSX and VDDX, or VSSA and VDDA.}
–0.3
–6.0
–0.3
–0.3
–0.3
–0.3
–25
–25
–65
Max
Unit
6.0
V
0.3
V
0.3
V
6.0
V
6.0
V
2.16
V
+25
mA
+25
mA
155
°C
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2. ESD and Latch-up Test Conditions
Model
Human Body
Description
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Symbol
Value
Unit
R1
1500
Ω
C
100
pF
-
-
3
3
1070
MC9S12G Family Reference Manual, Rev.1.10
Freescale Semiconductor