TLK3132 Datasheet, PDF (9/103 Pages) Texas Instruments – 2-Channel Multi-Rate Transceiver

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1 Introduction
TLK3132
2-Channel Multi-Rate Transceiver
SLLS956 – DECEMBER 2008
1.1 Features
• Two Channel 600Mbps to 3.75Gbps Multi-Rate
Transceiver
• Supports 1X/2X Fibre Channel (FC), CPRI
(x1/x2/x4), OBSAI (x1/x2/x4), and 1GbE
(1000Base-X) Data Rates
• IEEE Compliant 1000Base-X PCS Support
• Supports Independent Channel SERDES
Operation Modes in 8/10 Bit Data Modes (TBI
and 8 Bit + Control)
• Serial Side Transmit De-Emphasis and Receive
Adaptive Equalization to Allow Extended
Backplane Reach
• Low Jitter LC Oscillator Jitter-Cleaner Allows
use of Poor Quality REFCLK
• Full Datapath Loopback Capability
(Serial/Parallel Side)
• Supports PRBS 2⁷-1 and 2²³ – 1 Gen/Verify.
Supports Standard Defined CRPAT, High and
Low Frequency, and Mixed Frequency Testing.
• GMII/RGMII: HSTL Class 1 I/O With On-Chip
Termination: Programmable Input and 50Ω
Output (1.5 and 1.8V Power Supply)
1.2 PIN OUT
• GMII/RGMII: Source and Data Centered I/O
Timing Modes
• Supports Jumbo Packet (9600 Byte Maximum)
Operation
• MDIO: IEEE 802.3 Clause 22 Compliant
Management Data Input / Output Interface
Modes (Either 1.2V or 2.5V MDIO I/O)
• 1.2V Core, 1.5V/1.8V HSTL I/O Supply, and 2.5V
LVCMOS I/O Supply
• JTAG: IEEE 1149.1/1149.6 Test Interface
• ±200 ppm Clock Tolerance in 1000Base-X
Receive Datapaths
• 90 nm Advanced CMOS Technology
• Package: PBGA, 15×15mm, 196 Ball, 1mm
Pitch
• 1.1W Maximum Power Dissipation at 2CH 3.75
Gbps (1.5V HSTL Mode, Input HSTL
Termination Disabled)
• Asymmetric RX/TX Rates Supported
• Industrial Ambient Operating Temperature
(–40°C to 85°C) at Full Rate
TLK3132
TXCLK(1:0)
TXD(15..0)
2
TXC(5,4,1,0) ^TDP/N[1:0]
RXCLK(1:0) _RDP/N[1:0]
2
RXD(15..0)
RXC(5,4,1,0)
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Instruments semiconductor products and disclaimers thereto appears at the end of this document.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated