W631GG6KB-15 Datasheet, PDF (113/158 Pages) Winbond – Double Data Rate architecture: two data transfers per clock cycle

W631GG6KB
9.9.2 ODT DC Electrical Characteristics
An overview about the specification requirements for RTT and ΔVM is provided in Table 32.
Table 32 – ODT DC Impedance and Mid-Level Requirements
MR1 A9, A6, A2 RTT Resistor
Vout
Min. Nom. Max. Unit
Notes
0, 1, 0
120 Ω RTT120
0.9
1.0
1.6 RZQ/2 1, 2, 3, 4
0, 0, 1
60 Ω RTT60
0.9
1.0
1.6 RZQ/4 1, 2, 3, 4
0, 1, 1
40 Ω RTT40 VIL(AC) to VIH(AC) 0.9
1.0
1.6 RZQ/6 1, 2, 3, 4
1, 0, 1
30 Ω RTT30
0.9
1.0
1.6 RZQ/8 1, 2, 3, 4
1, 0, 0
20 Ω RTT20
0.9
1.0
1.6 RZQ/12 1, 2, 3, 4
Deviation of VM with respect to VDDQ/2, ΔVM
-5
+5
% 1, 2, 3, 4, 5
Notes:
1. With RZQ = 240 Ω.
2. The tolerance limits are specified after calibration with stable voltage and temperature. For the behavior of the tolerance
limits if temperature or voltage changes after calibration, see the following section ODT temperature and voltage sensitivity.
3. The tolerance limits are specified under the condition that VDDQ = VDD and that VSSQ = VSS.
4. Measurement definition for RTT :
Apply VIH(AC) to pin under test and measure current I(VIH(AC)), then apply VIL(AC) to pin under test and measure current
I(VIL(AC)) respectively. Calculate RTT as follows:
RTT = [VIH(AC) - VIL(AC)] / [I (VIH(AC)) - I (VIL(AC))]
5. Measurement definition for VM and ΔVM:
Measure voltage (VM) at test pin (midpoint) with no load. Calculate ΔVM as follows:
ΔVM = (2 × VM / VDDQ - 1) × 100%.
9.9.3 ODT Temperature and Voltage sensitivity
If temperature and/or voltage change after calibration, the tolerance limits widen according to Table 33
and Table 34. The following definitions are used:
ΔT = T - T (@calibration);ΔV = VDDQ- VDDQ (@calibration); VDD = VDDQ
SYMBOL
RTT
Table 33 – ODT Sensitivity Definition
MIN.
0.9 - dR_TTdT × |ΔT| - dR_TTdV × |ΔV|
MAX.
1.6 + dR_TTdT × |ΔT| + dR_TTdV × |ΔV|
UNIT
RZQ/2,4,6,8,12
Table 34 – ODT Voltage and Temperature Sensitivity
SYMBOL
MIN.
MAX.
UNIT
dR_TTdT
0
1.5
%/°C
dR_TTdV
0
0.15
%/mV
Note: These parameters may not be subject to production test. They are verified by design and characterization
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Publication Release Date: Feb. 27, 2013
Revision A04