TLK3131_15 Datasheet, PDF (98/102 Pages) Texas Instruments – Single Channel Multi-Rate Transceiver

TLK3131
SLLS957A – DECEMBER 2008 – REVISED DECEMBER 2009
www.ti.com
C APPENDIX C – Device Test Mode
This device can be placed into one of the three modes: functional mode including JTAG testing mode,
scan testing mode, and Jadis/eFuse testing mode. The scan testing mode and Jadis/eFuse testing modes
are for TI use only, and may be ignored by external users of this device.
Table C-1. Device Mode Configuration
FUNCTIONAL DEVICE PIN
NAME
TESTEN
GPI1
FUNCTIONAL MODE/JTAG TESTING
0 or 1
0
SCAN MODE
0
1
Jadis/eFuse MODE
1
1
Table C-2. Device Test Mode Pin Configuration
FUNCTIONAL FUNCTIONAL MODE
DEVICE PIN NAME SIGNAL DIRECTION
SPEED1
I
SPEED0
I
PLOOP
I
SLOOP
I
PRBS_EN
I
CODE
I
TEST MODE
SIGNAL
DIRECTION
I
I
I
I
I
I
TDI
I
I
PRTAD4
PRTAD3
PRTAD2
I
I
I
I
I
I: Jadis/eFuse
O: Scan
PRTAD1
I
I
PRTAD0
I
I
GPO0
O
O
GPO1
O
O
GPO2
O
O
GPO3
O
O
GPO4
O
O
FUNCTIONAL
MODE/JTAG
TESTING
SPEED1
SPEED0
PLOOP
SLOOP
PRBS_EN
CODE
TDI
PRTAD4
PRTAD3
SCAN MODE
Jadis/eFuse
MODE
Scan In 5
Scan In 4
Scan In 3
Scan In 2
Scan In 1
Scan Enable
Adaptive Scan Enable (Test
Mode)
Scan HS Enable (Transition
Fault)
Scan Clock
STCI_D
EFUSE_TMS
EFUSE_TDI
STCICFG1
EFUSE_INITZ
TESTCLK_T
JADIS_EFUSE_SE
L
TESTCLK_R
STCICLK
PRTAD2
Scan Out 5
STCICFG0
PRTAD1
PRTAD0
TEST_DOUT0
TEST_DOUT1
TEST_DOUT2
TEST_DOUT3
TEST_DOUT4 or
JC PLL Digital Test
Out
Scan Clock Select (0: from
device pin, 1: from Jadis), also EFUSE_SYS_CLK
EFUSE_SYS_CLK
HSTL Force Down
EFUSE_TCK
Scan Out 4
Tied LOW
Scan Out 3
Tied LOW
Scan Out 2
STCI_Q
Scan Out 1
EFUSE_TDO
Burnin_Output
Burnin_Output
SPACER
Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Original (December 2008) to A Revision ................................................................................................ Page
• Added text to (BIT 0:15) - This is a global bit (not per channel). Asserting this bit is equivalent to asserting the
device primary input RST_N. ..................................................................................................... 33
• Changed the Transmit Template figure - Y-axis values ....................................................................... 70
98
APPENDIX C – Device Test Mode
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