TLK3131_15 Datasheet, PDF (57/102 Pages) Texas Instruments – Single Channel Multi-Rate Transceiver

TLK3131
www.ti.com
SLLS957A – DECEMBER 2008 – REVISED DECEMBER 2009
• 1000Base-X Based Continuous Random Pattern (CRPAT) Long/Short Test Pattern:
– Device Pin Setting(s):
• Ensure CODE primary input pin is high.
– Reset Device:
• Issue a hard or soft reset (RST_N asserted –or- Write 1 to 0.15)
– Power down channel 1 per procedure in previous device initialization section.
• Select single ended or differential REFCLK input:
– If Single Ended REFCLK used - Write 2’b01 to 37120.15:14
– If Differential REFCLK used – Write 2’b00 to 37120.15:14
– Select SERDES TX Reference Clock Input:
• If Single Ended REFCLK used - Write 2’b10 to 37120.11:10
• If Differential REFCLK used – Write 2’b11 to 37120.11:10
– Select SERDES RX Reference Clock Input:
• If Single Ended REFCLK used - Write 2’b10 to 37120.9:8
• If Differential REFCLK used – Write 2’b11 to 37120.9:8
– Ensure a legal reference clock operation frequency is selected based on Appendix A, and provision
control settings accordingly. It is also possible to use the Jitter Cleaner during these tests, and the
user should consult Appendix A for further Jitter Cleaner provisioning details.
– Enable Encoder/Decoder
• Write 1’b1 to 17.2
– Issue Datapath Reset:
• Write 1’b1 to 16.11
• Write 1’b0, then 1’b1, followed by 1’b0 to 37636.14
– Select Test Pattern:
• If CRPAT Long Pattern is desired:
– Write 3’b011 to 16.2:0
• If CRPAT Short Pattern is desired:
– Write 3’b100 to 16.2:0
– Enable Test Pattern Generation:
• Write 1’b1 to 16.4
– Clear Counters:
• Read 23.15:0 and 24.15:0 and discard the values.
– Enable Test Pattern Verification:
• Write 1’b1 to 16.3
– Verify Test In Progress:
• Poll 21.0 asserted.
– The pattern verification is now in progress.
– Verify Error Free Operation (as many times as desired during the duration of the test period):
• Read 23.15:0, and verify 16’h0000 is read to confirm error free operation.
• Read 24.15:0, and verify 16’h0000 is read to confirm error free operation.
If more than one test is specified results are unpredictable.
If another test type is desired, please begin at the first step of that procedure.
Copyright © 2008–2009, Texas Instruments Incorporated
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Device Reset Requirements/Procedure
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