TLK3131_15 Datasheet, PDF (13/102 Pages) Texas Instruments – Single Channel Multi-Rate Transceiver

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TLK3131
TLK3131
SLLS957A – DECEMBER 2008 – REVISED DECEMBER 2009
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Figure 2-1. Single 10-Bit SERDES Application
Figure 2-2 shows the TLK3131 in a 1000Base-X Remote Loopback Application. It is possible to configure
serial side loopback in SERDES mode.
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PCS CORE
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Figure 2-2. 1000Base-X – Remote (Serial) Loopback Application
Figure 2-3 shows the TLK3131 in a Local Loopback Application.
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Figure 2-3. 1000Base-X – Local (Parallel ) Loopback Application
The TLK3131 supports the IEEE 802.3 defined Management Data Input/Output (MDIO) Interface to allow
ease in configuration and status monitoring of the link. The bi-directional data pin (MDIO) must be
externally pulled up to 1.2V or 2.5V (VDDM) per the standard for MDIO.
The TLK3131 supports the IEEE 1149.1/1149.6 defined JTAG test port for ease in board manufacturing
test. It also supports a comprehensive series of built-in tests for self-test purposes including PRBS
generation and verification, CRPAT, Mixed/High/Low Frequency testing.
The TLK3131 operates with a 1.2V core voltage supply, a 1.5/1.8V HSTL I/O voltage supply and a 2.5V
LVCMOS/bias supply.
The TLK3131 is packaged in a 13×13mm, 144-ball, 1mm ball pitch Plastic Ball Grid Array (PBGA)
package and is characterized for operation from –40°C to 85°C Ambient, 105°C Junction, and 5% power
supply variation at the balls of the device unless noted otherwise.
The following block diagram provides a high level description of the TLK3131.
Copyright © 2008–2009, Texas Instruments Incorporated
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Detailed Description
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