MC9S12NE64_06 Datasheet, PDF (534/554 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
NOTE
All values shown in Table A-26 are target values and subject to further
extensive characterization.
Table A-26. NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
1
C Data retention at an average junction temperature of
T_Javg = 85°C
2
C Data retention at a junction temperature of
T_J = 140°C
3
C FLASH number of program/erase cycles
Symbol
t_NVMRET
t_NVMRET
n_FLPE
Min
15
10
10,000
Typ
Max
Unit
Years
Years
Cycles
MC9S12NE64 Data Sheet, Rev. 1.1
534
Freescale Semiconductor