MC9S12NE64_06 Datasheet, PDF (505/554 Pages) Freescale Semiconductor, Inc – Microcontrollers

ESD Protection and Latch-Up Immunity
Model
Human Body
Machine
Latch-up
Table A-2. ESD and Latch-Up Test Conditions
Description
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Minimum input voltage limit
Maximum input voltage limit
Symbol
R1
C
—
R1
C
—
Value
1500
100
—
3
3
0
200
—
3
3
–2.5
7.5
Unit
Ω
pF
Ω
pF
V
V
Num
1
2
3
4
5
Table A-3. ESD and Latch-Up Protection Characteristics
C
Rating
Symbol
Human Body Model (HBM)
C
Only PHY_TXP, PHY_TXN,
PHY_RXP, PHY_RXN pins
V_HBM
Machine Model (MM)
C
Only PHY_TXP, PHY_TXN,
PHY_RXP, PHY_RXN pins
V_MM
Charge Device Model (CDM)
C
Only PHY_TXP, PHY_TXN, ^VCDM
PHY_RXP, PHY_RXN pins
Latch-up Current at 125°C
C
positive
I_LAT
negative
Latch-up Current at 27°C
C
positive
I_LAT
negative
Min
2000
1000
200
100
500
250
+100
–100
+200
–200
Max
—
—
—
—
—
—
—
—
Unit
V
V
V
V
V
V
mA
mA
MC9S12NE64 Data Sheet, Rev. 1.1
Freescale Semiconductor
505