MC68HC11PH8 Datasheet, PDF(227/264 Page) Motorola, Inc – High-density Complementary Metal Oxide Semiconductor (HCMOS) Microcomputer Unit

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MC68HC11PH8 Datasheet, PDF (227/264 Pages) Motorola, Inc – High-density Complementary Metal Oxide Semiconductor (HCMOS) Microcomputer Unit

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1.3

Test methods

Clocks,

~VDD

strobes

Inputs

~VDD

Outputs

~VSS

0.4 V

~VSS

VDD Ã 0.8V

0.4 V

nominal

nominal

nominal timing

70% of VDD

20% of VDD

VDD Ã 0.8V

0.4 V

(b) DC testing

Clocks,

~VDD

strobes

Inputs

~VDD

Outputs

~VSS

20% of VDD ~VSS 20% of VDD

spec.

spec. timing

20% of VDD

70% of VDD

spec.

70% of VDD

VDD Ã 0.8V (2)

0.4V (2)

70% of VDD

20% of VDD

(c) AC testing

Notes:

(1) Full test loads are applied during all DC electrical tests and AC timing measurements.

(2) During AC timing measurements, inputs are driven to 0.4V and VDD Ã 0.8V;

timing measurements are taken at the 20% and 70% of VDD points.

Figure A-1 Test methods

12

MC68HC11PH8

ELECTRICAL SPECIFICATIONS (STANDARD)

TPG

MOTOROLA

A-3

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