C8051F850-C-GM Datasheet, PDF (319/328 Pages) Silicon Laboratories – Low-Cost 8-bit MCU Family with up to 8 kB of Flash

28.2. Temperature Sensor Offset and Slope
The temperature sensor slope and offset characteristics of Revision B devices are different than the slope
and offset characteristics of Revision C devices. The differences are:
Table 28.1. Temperature Sensor Revision Differences
Parameter
Revision B
Offset
Slope
Revision C
Offset
Slope
Symbol
Test Condition
Min
Typ
Max Unit
V_OFF
M
T_A = 0 °C
—
713
—
mV
—
2.67
— mV/°C
V_OFF
M
T_A = 0 °C
—
757
—
mV
—
2.85
— mV/°C
Firmware that uses the slope and offset of the temperature sensor to calculate the temperature from the
sensor ADC reading can detect the revision of the device by reading the REVID register and adjust the
slope and offset calculations based on the result. A REVID value of 0x01 indicates a Revision B device,
and a REVID value of 0x02 indicates a Revision C device.
28.3. Flash Endurance
The flash endurance, or number of times the flash may be written and erased, on some Revision B devices
may be lower than expected. Table 1.4 specifies a minimum Endurance (Write/Erase Cycles) as 20000,
but some Revision B devices may support a minimum of ~5000 cycles.
28.4. Latch-Up Performance
Pulling the device pins below ground and drawing significant current (~3.5 mA) can cause a Power-On
Reset event with Revision B devices. Some pins, like P0.0 and P0.1, are more susceptible to this behavior
than others. This behavior is outside normal operating parameters and would typically be seen during
latch-up or ESD performance testing.
28.5. Unique Identifier
Revision B devices do not implement the unique identifier described in “Device Identification and Unique
Identifier” on page 64.
Rev. 1.0
286