C8051F850-C-GM Datasheet, PDF (23/328 Pages) Silicon Laboratories – Low-Cost 8-bit MCU Family with up to 8 kB of Flash

1.4. Absolute Maximum Ratings
Stresses above those listed under Table 1.13 may cause permanent damage to the device. This is a stress
rating only and functional operation of the devices at those or any other conditions above those indicated
in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
For more information on the available quality and reliability data, see the Quality and Reliability Monitor
Report at http://www.silabs.com/support/quality/pages/default.aspx.
Table 1.13. Absolute Maximum Ratings
Parameter
Symbol
Test Condition
Min
Max
Ambient Temperature Under
Bias
T_BIAS
–55
125
Storage Temperature
Voltage on V_DD
Voltage on I/O pins or RST
T_STG
V_DD
V_IN
Total Current Sunk into Supply
Pin
I_VDD
V_DD > 3.3 V
V_DD < 3.3 V
–65
GND–0.3
GND–0.3
GND–0.3
—
150
4.2
5.8
V_DD+2.5
400
Total Current Sourced out of
Ground Pin
I_GND
400
—
Current Sourced or Sunk by Any I_PIO
I/O Pin or RST
-100
100
Operating Junction Temperature T_J
Commercial Grade Devices
–40
105
(-GM, -GS, -GU)
Industrial Grade Devices
–40
125
(-IM, -IS, -IU)
Note: Exposure to maximum rating conditions for extended periods may affect device reliability.
Unit
°C
°C
V
V
V
mA
mA
mA
°C
°C
Rev. 1.0
22