GXLV Datasheet, PDF (196/247 Pages) National Semiconductor (TI) – Geode™ GXLV Processor Series Low Power Integrated x86 Solutions

Electrical Specifications (Continued)
6.7 AC CHARACTERISTICS
The following tables list the AC characteristics including
output delays, input setup requirements, input hold
requirements, and output float delays. The rising-clock-
edge reference level V_REF, and other reference levels are
shown in Table 6-13. Input or output signals must cross
these levels during testing.
Input setup and hold times are specified minimums that
define the smallest acceptable sampling window for which
a synchronous input signal must be stable for correct oper-
ation.
All AC tests are performed at V_CC2 = 2.1V to 2.31V (2.2V
Nominal), V_CC2 = 2.37V to 2.63V (2.5V Nominal), V_CC2 =
2.76V to 3.05V (2.9V Nominal), V_CC3 = 3.0V to 3.6V (3.3V
Nominal), T_C = 0^oC to 85^oC, R_L = 50 ohms, and C_L = 50
pF unless otherwise specified
While most minimum, maximum, and typical AC charac-
teristics are only shown as a single value, they are tested
and guaranteed across the entire processor core voltage
range of 2.2V to 2.9V (nominal). AC characteristics that
are affected significantly by the core voltage or speed
grade are documented accordingly.
Table 6-13. Drive Level and Measurement
Points for Switching Characteristics
Symbol
Voltage (V)
V_REF
1.5
V_IHD
2.4
V_ILD
0.4
T_X
CLK
OUTPUTS
V_IHD
V_ILD
A
B _Min
Valid Output _n
Max
Valid Output _n+1
INPUTS
V_IHD
V_ILD
C
D
Valid Input
Legend: A = Maximum Output Delay Specification
B = Minimum Output Delay Specification
C = Minimum Input Setup Specification
D = Minimum Input Hold Specification
V_REF
V_REF
V_REF
Figure 6-4. Drive Level and Measurement Points for Switching Characteristics
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