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MC9S08AW16CFUE Datasheet, PDF (308/324 Pages) Freescale Semiconductor, Inc – MC9S08AW60 Features
Appendix A Electrical Characteristics and Timing Specifications
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
the table.
Table A-18. Conducted Susceptibility
Parameter
Symbol
Conditions
fOSC/fBUS
Result
A
Amplitude1
(Min)
±0
±2.02
Unit
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
VCS_EFT
VDD = 5.5V
TA = +25oC
package type
32768 Hz
crystal
2 MHz Bus
B
C
64 QFP
D
±2.5
kV
±3.0
>±3.0
1 Data based on qualification test results. Not tested in production.
2 The RESET pin is susceptible to the minimum applied transient of 220 V. All other pins have a result of A up to a minimum of
2000V.
The susceptibility performance classification is described in Table A-19.
Table A-19. Susceptibility Performance Classification
Result
A
B
Performance Criteria
No failure
The MCU performs as designed during and after exposure.
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E
Damage
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9S08AW60 Data Sheet, Rev 2
308
Freescale Semiconductor