TLK6002 Datasheet, PDF (93/96 Pages) Texas Instruments – Dual Channel 0.47Gbps to 6.25Gbps Multi-Rate Transceiver

TLK6002
www.ti.com
SLLSE34 – MAY 2010
9 Appendix E – Device Test Modes
This device can be placed into one of the four modes: functional mode including JTAG testing mode, scan
1 testing mode, scan 2 testing mode, and Cooper/eFuse testing mode. The scan 1, scan 2 and
Cooper/eFuse testing modes are for TI use only, and may be ignored by external users of this device.
FUNCTIONAL DEVICE
PIN NAME
TESTEN
GPI0
Table 9-1. Device Mode Configuration
FUNCTIONAL MODE/JTAG
TESTING
0
0
SCAN 1 MODE
0
1
SCAN 2 MODE
1
0
COOPER/EFUSE MODE
1
1
FUNCTIONAL
DEVICE PIN
NAME
CODEA_EN
RATE_A2
RATE_A1
RATE_A0
RATE_B2
RATE_B1
RATE_B0
REFCLK_A_SEL
REFCLK_B_SEL
CLK_OUT_SEL
CODEB_EN
TDI
PRBS_EN
PRTAD4
PRTAD3
PRTAD2
PRTAD1
PRTAD0
PRBSA_PASS
LOSA
PRBSB_PASS
LOSB
FUNCTIONAL
MODE SIGNAL
DIRECTION
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
O
O
O
O
Table 9-2. Device Test Mode Pin Configuration
TEST MODE
SIGNAL
DIRECTION
I
I
I
I
I
I
I
I
I
I
I
I
I
O or I
O or I
O or I
O or I
O or I
O
O
O
O
FUNCTIONAL
MODE/JTAG
TESTING
CODEA_EN
RATE_A2
RATE_A1
RATE_A0
RATE_B2
RATE_B1
RATE_B0
REFCLK_A_SEL
REFCLK_B_SEL
CLK_OUT_SEL
CODEB_EN
TDI
PRBS_EN
PRTAD4
PRTAD3
PRTAD2
PRTAD1
PRTAD0
PRBSA_PASS
LOSA
PRBSB_PASS
LOSB
SCAN 1 MODE
SCAN 2 MODE
COOPER/EFUSE
MODE
Scan In 8
Scan In 7
Scan In 6
Scan In 5
Scan In 4
Scan In 3
Scan In 2
Scan In 1
Scan Enable
At Speed Scan Enable
0: stuck-at fault
1: transition fault
Scan Clock Select (0:
from device pin, 1: from
Cooper), also
EFUSE_SYS_CLK
Adaptive Scan Enable
(Test Mode)
Scan Clock
Scan Out 8 (O)
Scan Out 7 (O)
Scan Out 6 (O)
Scan Out 5 (O)
Scan Out 4 (O)
Scan Out 3 (O)
Scan Out 2 (O)
Scan Out 1 (O)
Burnin_Output
Scan In 8
Scan In 7
Scan In 6
Scan In 5
Scan In 4
Scan In 3
Scan In 2
Scan In 1
Scan Enable
HSTL Force Up
STCICFG0
STCI_D
EFUSE_TMS
EFUSE_TDI
STCICFG1
EFUSE_INITZ
EFUSE_TRST
REFCLK_A_SEL
REFCLK_B_SEL
EFUSE_TCK
HSTL Force Down EFUSE_SYS_CLK
Adaptive Scan
TDI
Enable (Test Mode)
Scan Clock
STCICLK
Scan Out 8 (O)
TESTCLK_R (I)
Scan Out 7 (O)
efuse_cooper_sel (I)
(0: Cooper mode, 1:
eFuse mode)
Scan Out 6 (O)
TESTCLK_T (I)
Scan Out 5 (O)
Not Used (I)
Scan Out 4 (O)
Not Used (I)
Scan Out 3 (O)
Tied Low
Scan Out 2 (O)
STCI_Q
Scan Out 1 (O)
EFUSE_TDO
Burnin_Output
Burnin_Output
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Appendix E – Device Test Modes
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