I347-AT4 Datasheet, PDF (55/148 Pages) Intel Corporation – Intel® Ethernet Network Connection I347-AT4 Datasheet

Device Functionality—I347-AT4
CLK_SEL[0]
Register 27_4.11:10
CONFIG[1]
CONFIG[2]
Register 27_4.13:12
P0_OUT
P1_OUT
Mux
01 2 3
P2_OUT
P3_OUT
Figure 15. Serial LED
3.19
IEEE 1149.1 and 1149.6 Controller
The IEEE 1149.1 standard defines a test access port and boundary-scan architecture
for digital integrated circuits and for the digital portions of mixed analog/digital
integrated circuits. The IEEE 1149.6 standard defines a test access port and boundary-
scan architecture for AC coupled signals.
This standard provides a solution for testing assembled printed circuit boards and other
products based on highly complex digital integrated circuits and high-density surface-
mounting assembly techniques.
The I347-AT4 implements the instructions listed in Table 23. Upon reset, ID_CODE
instruction is selected. The PROG_HYST is a proprietary command used to adjust the
test receiver hysteresis threshold. The instruction opcodes are shown in Table 23.
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