TA1360ANG Datasheet, PDF (99/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note Characteristics
HB01 H-OUT pulse duty
Test Conditions
1. No signal input.
2. Measure T1 and T2 (as shown in the figure below) from #26 (H-OUT) output waveform when
subaddress (00) data is 80H and A0H. Calculate duties (TH_A and TH_B) using the following
equation:
TH = T1/(T1 + T2) × 100 %
T1
T2
#26 waveform
HB02 Horizontal free-run
frequency
1. Set SW20 to open.
2. Set subaddress (00) data to 01H and measure horizontal free-run frequency (F15K) according
to #26 (H-OUT) output waveform.
3. Set subaddress (00) data to 00H, 41H, 81H, C0H, and C1H. Measure horizontal free-run
frequency F28K, F31K, F33K, F37K, and F45K as in the step 2 above.
HB03 Horizontal oscillation 1. Set subaddress (00) data to 01H.
frequency variable
range
2. Connect 10-kΩ resistor between #20 and V_CC. Measure horizontal frequency (F15K_MIN)
according to #26 (H-OUT) output waveform.
3. Connect 68-kΩ resistor between #20 and GND. Measure horizontal frequency (F15K_MAX)
according to #26 (H-OUT) output waveform.
4. Set subaddress (00) data to 00H, 41H, 81H, C0H, and C1H. Repeat the steps 2 and 3 above
and measure horizontal frequencies F28K_MIN, F28K_MAX, F31K_MIN, F31K_MAX, F33K_MIN,
F33K_MAX, F37K_MIN, F37K_MAX, F45K_MIN, and F45K_MAX.
HB04 Horizontal oscillation 1. Set SW20 to open.
control sensitivity
2. Connect external power supply to TP 20, and set subaddress (00) data to 01H.
3. Apply V₂₀ + 0.05 V, and V₂₀ − 0.05 V to TP 20. Measure frequencies FA and FB according to
#26 (H-OUT) output waveform. Calculate frequency change rate (BH15K) using the following
equation.
BH15K = (FB − FA)/0.1
4. Set subaddress (00) data to 00H, 41H, 81H, C0H, and C1H. Repeat the step 2 above, and
measure frequency change rate BH28K, BH31K, BH33K, BH37K, and BH45K
HB05 H-OUT output
voltage
1. Set SW26 to open.
2. Measure voltage at High (V26_H) and Low (V26_L) of #26 (H-OUT) output waveform.
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2003-01-21