TA1360ANG Datasheet, PDF (61/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note No.
Characteristics
P22 Sharpness control center
characteristic
TA1360ANG
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
B
A
B
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
ON 1. Input sine wave to TPA. (The frequency is variable.)
2. Set the amplitude of #3 to 20 mVp-p.
3. Set unicolor to maximum (1111111), SRT-GAIN to minimum (00000), APACON peak frequency to 13.5 M
(00), and color detail enhancer (CDE) to center (10).
4. Set picture mute to OFF (P-MODE: Normal 1, 000), and monitor #43.
5. Set picture sharpness to center (1000000). Set input frequency to 100 kHz, and measure the amplitude
V₁₀₀.
6. Set picture sharpness to center (1000000). Set input frequency to F_AP00, measure #43 amplitude V_CEN00,
and calculate G_CEN00 using the following equations.
7. Set APACON peak frequency to 9.5 M (01). Set input frequency to F_AP01, measure V_CEN01 and calculate
G_CEN01.
8. Set APACON peak frequency to 6.4 M (10). Set input frequency to F_AP10, measure V_CEN10 and calculate
G_CEN10.
9. Set APACON peak frequency to 4.5 M (11). Set input frequency to F_AP11, measure V_CEN11 and calculate
G_CEN11.
G_CEN*** = 20 × log (V_CEN*** ÷ V₁₀₀) [dB]
Note: When a spectrum analyzer is used, measure gain for low frequency.
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2003-01-21