TA1360ANG Datasheet, PDF (52/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note No.
Characteristics
P13 Light area Yγ correction point
SW1
A
Test Conditions
SW Mode
SW2 SW3 SW7
B
C
A
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
OPEN 1. Connect external power supply PS1 to #3, external power supply PS2 to TP1, and set PS2 to 0 V.
2. Set dark area static Yγ gain [1C] to 0dB [17], and bright area static Yγ gain [1C] to 0dB [17].
3. Increase PS1 from V₃ [V] to V₃ [V] + 0.7 [V], and plot the voltage change of #43 picture period. Take 0 for V₃
[V] when the change is plotted. (V₃ is pin voltage of pin 3)
4. Set light area static Yγ gain [1C] to MAX [04].
5. Increase PS1 from V₃ [V] to V₃ [V] + 0.7 [V], and plot the voltage change of #43 picture period.
6. Measure VLGP using the following figure, and PLGP using the following equation.
LGP = (VLGP [V] − V₃ [V])/0.7 [V] × 100 (IRE)
#43 voltage [V]
ON
OFF
#3 voltage [V]
V₃
VLGP _{V3 + 0.7 V}
(100IRE)
52
2003-01-21