TA1360ANG Datasheet, PDF (97/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note Characteristics
HA07 Curve correction
amount
Test Conditions
1. Set subaddress (00) data to 40H.
2. Input signal B (as shown in the figure below) to TP16.
3. Connect external voltage to #23 (curve correction), and measure phase change amount
(∆H#23) of #26 (H-OUT) output waveform at 1.5 V and 3.5 V.
31.75 µs
Signal B
#26 waveform
(#23 voltage; 1.5 V)
#26 waveform
(#23 voltage; 3.5 V)
2.35 µs
1.5 V
∆H#23
HA08 Clamp pulse phase,
width and level
1. Set subaddress (00) data to 40H.
2. Input signal B (as shown in the figure below) to TP16.
3. Measure #18 (SCP output) clamp pulse phase (CP_S0), width (CP_PW0), and output level
(CP_V0) in relation to signal B.
4. Set subaddress (01) data to 81H, and repeat the step 3 above to measure (CP_S1), (CP_W1),
and (CP_V1).
5. Apply no signal input to TP16.
6. Measure #18 clamp pulse phase (CP_S2), width (CP_W2), and output level (CP_V2) in relation to
#24.
31.75 µs
Signal B
#18 waveform
2.35 µs
CP_S0/1
1.5 V
CP_V0/1
CP_W0/1
#24 waveform
#18 waveform
CP_S2
CP_V2
CP_W2
97
2003-01-21