TA1360ANG Datasheet, PDF (53/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note No.
Characteristics
P14 Light area dynamic Yγ gain
TA1360ANG
SW1
A
Test Conditions
SW Mode
SW2 SW3 SW7
B
C
A
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
OPEN 1. Connect external power supply PS1 to #3, external power supply PS2 to TP7, and set PS2 to 1.2 V.
2. Set dark area static Yγ gain [1C] to 0dB [17], and light area static Yγ gain [1C] to 0dB [17].
3. Set PS1 to V₃ [V], and measure #43 picture period voltage VLDGOFF1.
4. Set PS1 to VLGP [V], and measure #43 picture period voltage VLDGOFF2.
5. Set light area static Yγ gain [1C] to MAX [14], PS2 to 0 V, PS1 to VLGP [V], determine #43 picture period
voltage VLDGMAX [V] using the following equations.
VLDGMAX − VLDGOFF2 = A
VLDGOFF2 − VLDGOFF1 = B
GLDG = 20 × log [B/(B − A)]
#43 voltage [V]
VLDGMAX
VLDGOFF2
ON
VLDGOFF1
V₃
OFF
VLGP
VLDGMAX − VLDGOFF2 = A
VLDGOFF2 − VLDGOFF1 = B
#3 voltage [V]
V₃ + 0.7 V
(100IRE)
53
2003-01-21