TA1360ANG Datasheet, PDF (84/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note
No.
Characteristics
T17 ACB insertion
pulse phase
and amplitude
SW3
A
or
C
SW4
B
SW5
B
Test Conditions
SW Mode
SW33 SW34 SW35
A
A
A
SW37
A
SW38
A
SW39
A 1.
2.
Test Method
Input signal 1(f₀ = 100 kHz, picture period amplitude = 0.2 Vp-p) from pin 3. Control drive
gain adjustment data so that pins 41 and 42 picture period amplitude equals that of pin 43.
Set brightness data to 108.
Measure pins 46, 47, and 48 voltage. Apply measured voltages from external power supply.
3. Set subaddress (02) data to (40).
4. Use output signals from pins 43, 42, and 41, and measure ACB insertion pulse phase as
shown in the Figure 1.
Note: Take picture period following FBP input fall after VɾBLK ends as phase 1H. After next Hŋ
BLK, count the phase as 2H, 3H, and so on.
VŋBLK period
ACB insertion pulse
Figure 1: RGB Output
1H
2H
3H
4H
Figure 2: FBP Input (#24)
5. Monitor pins 43, 42, and 41. Measure ACB insertion pulse amplitudes (level from picture
period amplitude at quiescent.): VACB1R, VACB1G, and VACB2B.
6. Set subaddress (02) data to (80), and repeat the step 5 above: VACB2R, VACB2G, and
VACB2B.
7. Set subaddress (02) data to (C0), and repeat the step 5 above: VACB3R, VACB3G, and
VACB3B.
84
2003-01-21