TA1360ANG Datasheet, PDF (65/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note No.
Characteristics
P27 Y group delay correction
TA1360ANG
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
B
A
B
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
ON 1. Input Multi Burst signal (4.2-MHz frequency, 0.1 Vp-p at #3) of A signal in TPA. Set unicolor to maximum
(1111111), SRT-GAIN to minimum (00000), and Color detail enhancer (CDE) to minimum (00000).
2. Set sharpness to flat (DEC [30]),
APACON peak frequency to 4.5
M (11), and monitor #43.
3. Sine wave signal A input
becomes like signal B on #43 as
shown in the figure on the right.
Measure S_A and S_B.
Signal
A
4. When group delay correction is
set to minimum (0000), signal A
becomes like signal C on #43.
Measure S_AMIN and S_BMIN.
S_A
Signal
B
5. When group delay correction is
S_B
set to maximum (1111), signal A
becomes like signal D on #43.
Measure S_AMAX and S_BMAX.
6. Calculate the following equations.
G_AMIN = 20 × log (S_AMIN/S_A) [dB]
G_BMIN = 20 × log (S_BMIN/S_B) [dB]
Signal ^SAMIN
C
G_AMAX = 20 × log (S_AMAX/S_A) [dB]
G_BMAX = 20 × log (S_BMAX/S_B) [dB]
S_BMIN
Signal
D
S_AMAX
S_BMAX
Note: Sine wave input starts and ends within the picture period such as a burst signal. The wave is not
continuous.
65
2003-01-21