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TA1360ANG Datasheet, PDF (62/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic
Note No.
Characteristics
P23 2T pulse response SRT
control
TA1360ANG
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
B
A
B
SW56
Test Method (Test condition: VCC = 9 V/2 V, Ta = 25 ± 3°C)
ON 1. Input 2T pulse (0.7 Vp-p) signal to TPA. Set unicolor to maximum (1111111), SRT-GAIN to minimum
(00000), CDE to center (10) picture sharpness control to center (1000000).
2. Set APACON peak frequency to13.5 M (00), and monitor #43.
3. Measure TSRTMIN00 and VSRTMIN00 as shown in the figure below.
4. Set SRT-GAIN to maximum (11111), and measure TSRTMAX00 and VSRTMAX00.
5. Set APACON peak frequency to 9.5 M (01). Set SRT-GAIN to minimum (00000) and maximum (11111).
Measure TSRTMIN01/VSRTMIN01 and TSRTMAX01/ VSRTMAX01.
6. Set APACON peak frequency to 6.4 M (10). Set SRT-GAIN to minimum (00000) and maximum (11111).
Measure TSRTMIN10/VSRTMIN10 and TSRTMAX10/ VSRTMAX10.
7. Set APACON peak frequency to 4.5 M (11). Set SRT-GAIN to minimum (00000) and maximum (11111).
Measure TSRTMIN11/VSRTMIN11 and TSRTMAX11/VSRTMAX11.
8. Calculate the following equations.
TSRT00 = 20 × log [((VSRTMAX00/TSRTMAX00)/(VSRTMIN00/TSRTMIN00))
TSRT01 = 20 × log [(VSRTMAX01/TSRTMAX01)/(VSRTMIN01/TSRTMIN01)]
TSRT10 = 20 × log [(VSRTMAX10/TSRTMAX10)/(VSRTMIN10/TSRTMIN10)]
TSRT11 = 20 × log [(VSRTMAX11/TSRTMAX11)/(VSRTMIN11/TSRTMIN11)]
T***
20%
20%
V***
100%
62
2003-01-21