TA1360ANG Datasheet, PDF (42/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Test Condition for Picture Quality (Sharpness) Block
Common Test Condition for Picture Quality (Sharpness) Block
1. SW4 = SW5 = B, SW8~SW10 = B, SW20 = ON, SW23 = B, SW33∼SW39 = A, SW54 = OPEN
2. Send bus control data as preset values, turn ACB operation switching to ACB OFF (00), select Sync input (1), turn P-MODE to Normal 1(000), WPL-LEVEL to
max (111), and change subaddress (1C) to (03).
3. Input sync signal, which is in sync with input signal for testing except “Sweep”, to #14 (Sync input). “H-Freq.” should be the same frequency as the one of #14.
4. Set Y/color difference input mode to (0), sync separator level to 20 % (01), and vertical free-running frequency to 307H (110).
Note No.
Characteristics
P01 Black detection level shift
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
C
C
B
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
OPEN 1. Connect external power supply PS to #3, and monitor #2 and #56.
2. Set black stretch point 1 to OFF (000), and black detection level to 0 IRE (1).
3. Increase PS voltage from 4.95 V in steps of 1 mV. At the moment when #2 picture period (High) drops to
Low level, monitor DC difference on #56 V_B.
4. Set black detection level to 3 IRE (0).
5. Repeat the step 3 above and monitor DC difference, V_B3 on #56.
#56 waveform
V_B, V_B3
#2 waveform
P02 Black stretch amp maximum
B
A
A
B OPEN 1. Set SW2 to A (maximum gain), and input 500-kHz sine wave to TPA.
gain
2. Adjust signal amplitude to 0.1 Vp-p on #3.
3. Set black stretch point 1 to OFF (000), and measure #56 amplitude V_A.
4. Set black stretch point 1 to 001 (black stretch ON), and measure #56 amplitude V_B.
5. Calculate GBS using a following equation.
GBS = 20 × log (V_B ÷ V_A) [dB]
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2003-01-21