TA1360ANG Datasheet, PDF (91/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note
No.
Characteristics
T35 Blue stretch
point/gain
SW3
A
SW4
B
SW5
B
Test Conditions
SW Mode
SW33 SW34 SW35 SW37 SW38 SW39
Test Method
A
A
A
A
A
A 1. Input RAMP signal 0.7 Vp-p from pin 3.
2. Set subcontrast data to maximum.
3. Set subaddress (15) data to (0C).
4. Set subaddress (1A) data to (C0), monitor pin 41, and measure blue stretch start point using
the figure below (BLP_min).
5. Set subaddress (1A) data to (CC), and repeat the step 4 above. (BLP_max)
6. Set subaddress (1A) data to (C4).
7. Monitor pin 41 and measure gradient at blue stretch ON in decibel in relation to the one at
blue stretch OFF according to the figure below. (BLG_max)
8. Set subaddress (15) data to (04), and repeat the step 7 above. (BLG_min)
Note: Calculate blue stretch start point in IRE as setting positive amplitude at pedestal level of
output signal to 2.3 Vp-p = 100 IRE.
Output amplitude
Blue stretch ON
Blue stretch OFF
Input amplitude
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2003-01-21