TA1360ANG Datasheet, PDF (72/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Test Conditions for Color Difference Block 2
Common Test Conditions for Color Difference Block 2
1. SW1 = B, SW2 = B, SW7~SW10 = B, SW20 = ON, SW23 = B
2. Unless otherwise specified, measure each bus data with preset values.
3. Set the following data.
Subaddress (00)
Data (02)
Subaddress (02)
Data (0C)
Subaddress (05)
Data (7F)
Subaddress (06)
Data (6C)
Subaddress (07)
Data (40)
Subaddress (0B) Data (7F)
Subaddress (0C) Data (84)
Subaddress (12)
Data (F0)
Subaddress (13)
Data (F0)
Subaddress (15)
Data (00)
Subaddress (18)
Data (00)
Subaddress (1A) Data (C0)
Subaddress (1B) Data (E0)
Subaddress (1C) Data (03)
Subaddress (1D) Data (78)
Note No.
Characteristics
A01 Color difference contrast
adjustment
characteristic
SW3
C
SW4
A
or
B
SW5
A
or
B
Test Conditions
SW Mode
SW33 SW34 SW35 SW37 SW38 SW39
Test Method
A
A
A
A
A
A 1. Set brightness to maximum, and subaddress (12) data to (F0).
2. Input signal 3 (f₀ = 100 kHz, picture period amplitude = 0.23 Vp-p) from pin 5.
3. Change unicolor data to maximum (7F), center (40), and minimum (00), and
measure pin 43 picture period amplitude V_uCYMAX, V_uCYCNT, and V_uCYMIN
respectively.
4. Determine unicolor amplitude ratio between maximum and minimum in
decibels. (∆V_uCY)
5. Repeat the steps 2 to 4 above with the following pins: Input (picture period
amplitude 0.2 Vp-p) from pin 4, and measure pin 41.
72
2003-01-21