TA1360ANG Datasheet, PDF (83/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note
No.
Characteristics
T16 Whitepeak
blue
characteristic
SW3
A
SW4
B
SW5
B
Test Conditions
SW Mode
SW33 SW34 SW35 SW37 SW38 SW39
Test Method
A
A
A
A
A
A 1. Input 0.7-Vp-p RAMP signal from pin 3.
2. Set subcontrast data to maximum.
3. Set subaddress (1F) data to (04).
4. Set subaddress (1E) data to (01), and monitor pin 41. Determine blue stretch start point
BS_Pmin using the figure below.
5. Repeat the step 4 above by changing subaddress (1E) data to (04) and (07). Determine blue
stretch start point BS_PCNT and BS_Pmax.
6. Set subaddress (1E) data to (04).
7. Monitor pin 41 and calculate ratio of blue stretch ON gradient in relative to blue stretch OFF
gradient in decibel (BS_GCNT) using the figure below.
8. Repeat the step 7 above by changing subaddress (1F) data to (00) and (07). Calculate
gradient ratio in decibel (BS_Gmin and BS_Gmax).
Note: Calculate white-peak blue start point in IRE as setting positive amplitude at pedestal level
of output signal to 2.3 Vp-p = 100 IRE.
ON
Output (Output from pin 41)
OFF
Start point
Input amplitude
83
2003-01-21