TA1360ANG Datasheet, PDF (67/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note No.
Characteristics
P29 Y detail control range
TA1360ANG
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
B
A
B
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
ON 1. Set unicolor to maximum (1111111), SRT-GAIN to minimum (00000), CDE to center (10), and APACON
peak frequency to 4.5 M (11). Input SWEEP signal to TPA.
2. Set #3 amplitude to 20mVp-p.
3. Set picture sharpness to center (1000000), Y detail control to maximum (1111), and monitor #43 with a
spectrum analyzer.
4. Set low frequency area to 0dB, and measure each peak level G_YDMAX.
5. Set Y detail control to center (1000), and measure peak level G_YDCEN.
6. Set Y detail control to minimum (0000), and measure peak level G_YDMIN.
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2003-01-21