TA1360ANG Datasheet, PDF (93/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note
No.
Characteristics
T37 White
letters
improvement
SW3
A
SW4
B
SW5
B
Test Conditions
SW Mode
SW33 SW34 SW35 SW37 SW38 SW39
A
A
A
A
A
A 1.
2.
3.
4.
5.
Test Method
Apply a pulse to pin 3 as shown in Figure A.
Monitor # 43 output waveform. Plot # 43 output amplitude when changing # 3 input signal
amplitude from 0 to 120 IRE (0.857 Vp-p) (See Figure B below).
Set subaddress (19) data to (80).
Monitor # 43 output waveform. Plot # 43 output amplitude when changing # 3 input signal
amplitude from 0 to 120 IRE (0.857 Vp-p). Then, compare to the plot in the step 2, calculate
a point where a gradient changes (WPL1).
Repeat the step 4 above by changing subaddress (19) data to (83) and (86). Calculate
points where gradients change (WPL2, WPL3).
# 43 output
amplitude
WPL3
WPL2
WPL1
80 ns
Figure A
Data 87
Data 86
Data 83
Data 80
Figure B
# 3 input amplitude
93
2003-01-21