TA1360ANG Datasheet, PDF (66/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Note No.
Characteristics
P28 Color detail enhancer (CDE)
SW1
B
Test Conditions
SW Mode
SW2 SW3 SW7
B
A
B
SW56
Test Method (Test condition: V_CC = 9 V/2 V, Ta = 25 ± 3°C)
ON 1. Set unicolor to maximum (1111111), SRT-GAIN to minimum (00000), color to center (1000000), and color
limiter level to 2 Vp (1). Input SWEEP signal to TPA so that #3 amplitude is 20 mVp-p. Set SW4 to A, and
input signal as shown in the figure below (#4 amplitude is 0.2 Vp-p) to TP4.
2. Set picture sharpness to center (1000000), Y detail control to center (1000), and monitor #41 with a spectrum
analyzer.
3. When CDE is at minimum (00), set low frequency area to 0dB, and determine peak level G_CDEMIN.
4. When CDE is at maximum (11), set low frequency area to 0dB, and determine peak level G_CDEMAX.
5. Calculate the following equation.
G_CDE00 = G_CDEMAX00 − G_CDEMIN00
6. When APACON peak frequency is 13.5 M (00), 9.5 M (01), 6.4 M (10), and 4.5 M (11), calculate G_CDE00,
G_CDE01, G_CDE10, and G_CDE11 respectively using above equation.
Output gain [dB]
BLK
period
picture period
0.2 Vp-p
0dB
max
min
Input frequency [MHz]
66
2003-01-21