TA1360ANG Datasheet, PDF (76/108 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1360ANG
Test Conditions for Text Block
Common Test Conditions for Text Block
1. SW1 = B, SW2 = B, SW7~SW10 = B, SW20 = ON, SW23 = B
2. Unless otherwise specified, measure each bus data with preset values.
3. Set the following data.
Subaddress (00) Data (02)
Subaddress (02) Data (0C)
Subaddress (05) Data (7F)
Subaddress (06) Data (6C)
Subaddress (07) Data (40)
Subaddress (0B) Data (7F)
Subaddress (0C) Data (84)
Subaddress (12) Data (F0)
Subaddress (13) Data (F0)
Subaddress (15) Data (00)
Subaddress (18) Data (00)
Subaddress (1A) Data (C0)
Subaddress (1B) Data (E0)
Subaddress (1C) Data (03)
Subaddress (1D) Data (78)
Note
No.
Characteristics
T01 AC gain
SW3
A
T02 Unicolor
A
adjustment
characteristic
T03 Brightness
A
adjustment
characteristic
SW4
B
B
B
SW5
B
B
B
Test Conditions
SW Mode
SW33 SW34 SW35
A
A
A
SW37
A
SW38
A
SW39
A 1.
2.
3.
Test Method
Input signal 1 (f₀ = 100 kHz, picture period amplitude = 0.2 Vp-p) from pin 3.
Measure pins 41, 42, and 43 picture period amplitude, V₄₁, V₄₂, and V₄₃.
Calculate AC gain using the following equations.
G_R = V₄₃/0.2 G_G = V₄₂/0.2 G_B = V₄₁/0.2
A
A
A
A
A
A 1. Input signal 1 (f₀ = 100 kHz, picture period amplitude = 0.2 Vp-p) from pin 3.
2. Change unicolor data to maximum (7F), center (40), and minimum (00) and measure pin 43
picture period amplitude, V_uMAX, V_uCNT, and V_uMIN respectively.
3. Calculate amplitude ratio of V_uMAX and V_uMIN in decibels (∆V_u)
A
A
A
A
A
A 1. Input signal 2 from pin 3 and adjust pin 43 picture period output amplitude to 1 Vp-p.
2. Change brightness data to maximum (7F), center (80), and minimum (00) and measure pin
43 voltages, V_brMAX, V_brCNT, and V_brMIN respectively.
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2003-01-21