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HYB18T512400AF Datasheet, PDF (78/117 Pages) Infineon Technologies AG – 512-Mbit DDR2 SDRAM
5.2
DC Characteristics
HYB18T512[40/80/16]0AF–[3/3S/3.7/5]
512-Mbit DDR2 SDRAM
AC & DC Operating Conditions
Table 25 Recommended DC Operating Conditions (SSTL_18)
Symbol
Parameter
Rating
Unit Note
Min.
Typ.
Max.
VDD
VDDDL
VDDQ
VREF
VTT
Supply Voltage
1.7
1.8
1.9
V
1)
Supply Voltage for DLL
1.7
1.8
1.9
V
1)
Supply Voltage for Output 1.7
1.8
1.9
V
1)
Input Reference Voltage
0.49 × VDDQ 0.5 × VDDQ
0.51 × VDDQ
V
2)3)
Termination Voltage
VREF – 0.04 VREF
VREF + 0.04
V
4)
1) VDDQ tracks with VDD, VDDDL tracks with VDD. AC parameters are measured with VDD, VDDQ and VDDDL tied together.
2) The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF
is expected to be about 0.5 × VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.
3) Peak to peak ac noise on VREF may not exceed ± 2% VREF (dc)
4) VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal
to VREF, and must track variations in die dc level of VREF.
Table 26 ODT DC Electrical Characteristics
Parameter / Condition
Symbol Min. Nom. Max.
Unit Note
Termination resistor impedance value for
Rtt1(eff) 60
75
90
Ω
1)
EMRS(1)[A6,A2] = [0,1]; 75 Ohm
Termination resistor impedance value for
Rtt2(eff) 120 150 180
Ω
1)
EMRS(1)[A6,A2] =[1,0]; 150 Ohm
Termination resistor impedance value for
Rtt3(eff) 40
50
60
Ω
1)
EMRS(1)(A6,A2)=[1,1]; 50 Ohm
Deviation of VM with respect to VDDQ / 2
delta VM –6.00 —
+ 6.00 %
2)
1) Measurement Definition for Rtt(eff): Apply VIH(ac) and VIL(ac) to test pin separately, then measure current I(VIHac) and I(VILac)
respectively. Rtt(eff) = (VIH(ac) – VIL(ac)) /(I(VIHac) – I(VILac)).
2) Measurement Definition for VM: Turn ODT on and measure voltage (VM) at test pin (midpoint) with no load:
delta VM = ((2 x VM / VDDQ) – 1) x 100%
Table 27 Input and Output Leakage Currents
Symbol Parameter / Condition
Min. Max.
IIL
Input Leakage Current; any input 0 V < VIN < VDD
–2
+2
IOL
Output Leakage Current; 0 V < VOUT < VDDQ
–5
+5
1) all other pins not under test = 0 V
2) DQ’s, LDQS, LDQS, UDQS, UDQS, DQS, DQS, RDQS, RDQS are disabled and ODT is turned off
Unit
µA
µA
Note
1)
2)
Data Sheet
78
Rev. 1.3, 2005-01
09112003-SDM9-IQ3P