LM3S5956-IQR80-C1 Datasheet, PDF (68/1144 Pages) Texas Instruments – Stellaris® LM3S5956 Microcontroller

Architectural Overview
NRND: Not recommended for new designs.
1.3.7
1.3.8
1.4
JTAG and ARM Serial Wire Debug (see page 177)
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface
for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Registers (DR)
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging. Texas
Instruments replaces the ARM SW-DP and JTAG-DP with the ARM Serial Wire JTAG Debug Port
(SWJ-DP) interface. The SWJ-DP interface combines the SWD and JTAG debug ports into one
module providing all the normal JTAG debug and test functionality plus real-time access to system
memory without halting the core or requiring any target resident code. The SWJ-DP interface has
the following features:
■ IEEE 1149.1-1990 compatible Test Access Port (TAP) controller
■ Four-bit Instruction Register (IR) chain for storing JTAG instructions
■ IEEE standard instructions: BYPASS, IDCODE, SAMPLE/PRELOAD, EXTEST and INTEST
■ ARM additional instructions: APACC, DPACC and ABORT
■ Integrated ARM Serial Wire Debug (SWD)
– Serial Wire JTAG Debug Port (SWJ-DP)
– Flash Patch and Breakpoint (FPB) unit for implementing breakpoints
– Data Watchpoint and Trace (DWT) unit for implementing watchpoints, trigger resources, and
system profiling
– Instrumentation Trace Macrocell (ITM) for support of printf style debugging
– Trace Port Interface Unit (TPIU) for bridging to a Trace Port Analyzer
Packaging and Temperature
■ Industrial-range (-40°C to 85°C) 64-pin RoHS-compliant LQFP package
Hardware Details
Details on the pins and package can be found in the following sections:
■ “Pin Diagram” on page 1041
■ “Signal Tables” on page 1042
■ “Operating Characteristics” on page 1067
■ “Electrical Characteristics” on page 1068
■ “Package Information” on page 1139
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October 06, 2012
Texas Instruments-Production Data