TC290 Datasheet, PDF (357/476 Pages) Infineon Technologies AG – 32-Bit Single-Chip Micocontroller

TC290 / TC297 / TC298 / TC299 BB-Step
Electrical SpecificationVADC Parameters
Table 3-28 VADC_33V (cont’d)
Parameter
Symbol
Values
Unit Note / Test Condition
Min.
Typ.
Max.
Switched capacitance of a
C_AREFS CC -
-
30
pF
reference input
RMS Noise ⁷⁾
EN_RMS CC -
-
Positive reference V_AREFx pin I_OZ2 CC
-6
-
leakage
-3.5
-
1.7 ⁶⁾⁸⁾
6
3.5
LSB
µA
µA
target
V_AREFx = V_AREF2;
V_AREF>V_DDMV ;
T_J>150°C
V_AREFx = V_AREF2;
V_AREF>V_DDMV ;
T_J≤150°C
-2
-
2.5
µA
V_AREFx = V_AREF2;
V_AREF≤V_DDMV ;
T_J>150°C
-1
-
1
µA
V_AREFx = V_AREF2;
V_AREF≤V_DDMV ;
T_J≤150°C
Negative reference V_AGNDx pin I_OZ3 CC
-12
-
leakage
12
µA
V_AGNDx = V_AGND2;
V_AGND<V_SSMV ;
T_J>150°C
-6.5
-
6.5
µA
V_AGNDx = V_AGND2;
V_AGND<V_SSMV ;
T_J≤150°C
-2.2
-
2
µA
V_AGNDx = V_AGND2;
V_AREF≤V_DDMV ;
T_J>150°C
-1
-
1
µA
V_AGNDx = V_AGND2;
V_AREF≤V_DDMV ;
T_J≤150°C
Resistance of the reference R_AREF CC -
-
3
kOhm
input path
CSD resistance ⁹⁾
R_CSD CC -
-
28
kOhm
Resistance of the pull-down R_PDD CC -
-
0.9
kOhm
test device ¹⁰⁾
CSD voltage accuracy ^{11) 12)} dVCSD CC -
-
10
%
1) If the reference voltage is reduced by the factor k (k < 1), TUE,DNL,INL,Gain, and Offset errors increase also by the factor
1/k. V_AREF must be decoupled with an external capacitor.
2) For QCONV = X pC and a conversion time of 1 µs a rms value of X µA results for I_AREFx.
3) For the details of the mapping for a VADC group to pin V_AREFx please see the User's Manual.
4) The broken wire detection delay against V_AGND is measured in numbers of consecutive precharge cycles at a conversion
rate higher than 1 conversion per 500 ms.
5) The broken wire detection delay against V_AREF is measured in numbers of consecutive precharge cycles at a conversion
rate higher than 1 conversion per 10 ms. This function is influenced by leakage current, in particular at high temperature.
6) Resulting worst case combined error is arithmetic combination of TUE and EN_RMS.
7) This parameter is valid for soldered devices and requires careful analog board design.
8) Value is defined for one sigma Gauss distribution.
Data Sheet
3-351
V 1.1 2015-05
TC290/TC297/TC298/TC299 BB-Step Data Sheet downloaded by saravanakumar maniyam (larsen and Toubro limited) at 08 Sep 2015 08:06