|
MC9S12XD256CAL Datasheet, PDF (136/1348 Pages) Freescale Semiconductor, Inc – This specification describes the function of the clocks and reset generator (CRG). | |||
|
◁ |
Chapter 4 Analog-to-Digital Converter (ATD10B16CV4) Block Description
Table 4-8. ATDCTL3 Field Descriptions (continued)
Field
2
FIFO
1:0
FRZ[1:0]
Description
Result Register FIFO Mode âIf this bit is zero (non-FIFO mode), the A/D conversion results map into the
result registers based on the conversion sequence; the result of the ï¬rst conversion appears in the ï¬rst result
register, the second result in the second result register, and so on.
If this bit is one (FIFO mode) the conversion counter is not reset at the beginning or ending of a conversion
sequence; sequential conversion results are placed in consecutive result registers. In a continuously scanning
conversion sequence, the result register counter will wrap around when it reaches the end of the result register
ï¬le. The conversion counter value (CC3-0 in ATDSTAT0) can be used to determine where in the result register
ï¬le, the current conversion result will be placed.
Aborting a conversion or starting a new conversion by write to an ATDCTL register (ATDCTL5-0) clears the
conversion counter even if FIFO=1. So the ï¬rst result of a new conversion sequence, started by writing to
ATDCTL5, will always be place in the ï¬rst result register (ATDDDR0). Intended usage of FIFO mode is
continuos conversion (SCAN=1) or triggered conversion (ETRIG=1).
Finally, which result registers hold valid data can be tracked using the conversion complete ï¬ags. Fast ï¬ag clear
mode may or may not be useful in a particular application to track valid data.
0 Conversion results are placed in the corresponding result register up to the selected sequence length.
1 Conversion results are placed in consecutive result registers (wrap around at end).
Background Debug Freeze Enable â When debugging an application, it is useful in many cases to have the
ATD pause when a breakpoint (Freeze Mode) is encountered. These 2 bits determine how the ATD will respond
to a breakpoint as shown in Table 4-10. Leakage onto the storage node and comparator reference capacitors
may compromise the accuracy of an immediately frozen conversion depending on the length of the freeze
period.
Table 4-9. Conversion Sequence Length Coding
S8C S4C S2C S1C
0
0
0
0
0
0
0
1
0
0
1
0
0
0
1
1
0
1
0
0
0
1
0
1
0
1
1
0
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
1
1
0
0
1
1
0
1
1
1
1
0
1
1
1
1
Number of Conversions
per Sequence
16
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
MC9S12XDP512 Data Sheet, Rev. 2.21
136
Freescale Semiconductor
|
▷ |