S912XEP100J5MAG Datasheet, PDF (1231/1324 Pages) Freescale Semiconductor, Inc – Features of the MC9S12XE-Family are listed here. Please see Table D-2.for memory options and Table D-2. for the peripheral features that are available on the different family members.

5. Maximum partitioning
Appendix A Electrical Characteristics
A.3.2 NVM Reliability Parameters
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Freescale Semiconductor
MC9S12XE-Family Reference Manual Rev. 1.25
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