MC68HC16Z1 Datasheet, PDF (177/500 Pages) Freescale Semiconductor, Inc – M68HC16Z Series

Freescale Semiconductor, Inc.
5.10.3 Data Registers
A write to the port E and port F data registers (PORTE[0:1] and PORTF[0:1]) is stored
in an internal data latch, and if any pin in the corresponding port is configured as an
output, the value stored for that bit is driven out on the pin. A read of a data register
returns the value at the pin only if the pin is configured as a discrete input. Otherwise,
the value read is the value stored in the register. Both data registers can be accessed
in two locations and can be read or written at any time.
5.11 Factory Test
The test submodule supports scan-based testing of the various MCU modules. It is in-
tegrated into the SIM to support production test. Test submodule registers are intend-
ed for Freescale use only. Register names and addresses are provided in APPENDIX
D REGISTER SUMMARY to show the user that these addresses are occupied. The
QUOT pin is also used for factory test.
M68HC16 Z SERIES
USER’S MANUAL
SYSTEM INTEGRATION MODULE
For More Information On This Product,
Go to: www.freescale.com
5-71