K522H1HACF-B050 Datasheet, PDF (25/94 Pages) Samsung semiconductor – MCP Specification

K522H1HACF-B050
datasheet
3.3 Input Data Latch Cycle
CLE
tCLH
tCH
CE
ALE
WE
I/Ox
tWC
tALS
tWP
tWH
tDS ^tDH
DIN 0
tWP
tDS ^tDH
DIN 1
tWP
tDS ^tDH
DIN final
Rev. 1.0
MCP Memory
3.4 * Serial Access Cycle after Read(CLE=L, WE=H, ALE=L)
CE
RE
I/Ox
tRC
tRP
tREA
tREH
tREA
Dout
tRHZ
Dout
tREA
tCHZ
tCOH
tRHZ
tROH
Dout
tRR
R/B
NOTE :
Transition is measured at ±200mV from steady state voltage with load.
This parameter is sampled and not 100% tested.
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