MB81P643287 Datasheet, PDF (52/65 Pages) Fujitsu Component Limited. – 8 x 256K x 32 BIT, FCRAMTM CORE BASED DOUBLE DATA RATE SDRAM

MB81P643287-50/-60
s SCITT TEST MODE
ABOUT SCITT
SCITT (Static Component Interconnection Test Technology) is an XNOR circuit based test technology that is
used for testing interconnection between SDRAM and SDRAM controller on the printed circuit boards. SCITT
provides inexpensive board level test mode in combination with boundary-scan. The basic idea is simple, consider
all output of SDRAM as output of XNOR circuit and each output pin has a unique mapping on the input of
SDRAM. The ideal schematic block diagram is as shown below.
Boundary
Scan
µC
ASIC
TEST
Control
xAddress
Bus
XNOR
Data Bus
SDRAM
CORE
TEST Control : CAS, CS, CKE
xAddress Bus : A0 to A10, BA0 to BA2, RAS, DM0 to DM3, CLK, CLK, WE
Data Bus
: DQ0 to DQ31, DQS0 to DQS3
It is static and provides easy test pattern that result in a high diagnostic resolution for detecting all open/short
faults.
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