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EP2C5T144I8N Datasheet, PDF (160/470 Pages) Altera Corporation – Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–47. High-Speed I/O Timing Definitions (Part 2 of 2)
Parameter
Symbol
Description
Sampling window
SW
Receiver input skew
margin
RSKM
Input jitter (peak to peak)
—
Output jitter (peak to peak) —
Signal rise time
tR I S E
Signal fall time
tFA L L
Lock time
tL O C K
The period of time during which the data must be valid in order for you
to capture it correctly. Sampling window is the sum of the setup time,
hold time, and jitter. The window of tSU + tH is expected to be centered
in the sampling window.
SW = TUI – TCCS – (2 × RSKM)
RSKM is defined by the total margin left after accounting for the
sampling window and TCCS.
RSKM = (TUI – SW – TCCS) / 2
Peak-to-peak input jitter on high-speed PLLs.
Peak-to-peak output jitter on high-speed PLLs.
Low-to-high transmission time.
High-to-low transmission time.
Lock time for high-speed transmitter and receiver PLLs.
Figure 5–3. High-Speed I/O Timing Diagram
External
Input Clock
Internal Clock
Receiver
Input Data
TCCS RSKM
Time Unit Interval (TUI)
Sampling Window (SW)
RSKM TCCS
Figure 5–4 shows the high-speed I/O timing budget.
5–56
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008