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MC68HC16Z1CAG16 Datasheet, PDF (293/500 Pages) Freescale Semiconductor, Inc – M68HC16Z Series users manual
Freescale Semiconductor, Inc.
Table A-10 25.17-MHz Clock Control Timing
(VDD and VDDSYN = 5.0 Vdc ± 5%, VSS = 0 Vdc, TA = TL to TH)
Num
Characteristic
PLL Reference Frequency Range1
1
MC68HC16Z1
MC68HC16Z2
MC68HC16Z3
System Frequency2
On-Chip PLL System Frequency
2
Slow On-Chip PLL System Frequency
Fast On-Chip PLL System Frequency
External Clock Operation
PLL Lock Time1, 7, 8, 9
Changing W or Y in SYNCR or exiting from
3
LPSTOP3
Warm Start-Up4
Cold Start-Up (fast reference option only)5
4 VCO Frequency6
Limp Mode Clock Frequency
5 SYNCR X bit = 0
SYNCR X bit = 1
CLKOUT Jitter1, 7, 8, 9, 10
6
Short term (5 µs interval)
Long term (500 µs interval)
Symbol
fref
fsys
tlpll
fVCO
flimp
J
clk
Min
20
3.2
3.2
dc
4 (fref)
4 (fref) /128
dc
Max
50
5.2
5.2
25.17
25.17
25.17
25.17
—
—
—
—
—
—
–1.0
–0.05
20
50
75
2 (fsys max)
fsys max/2
fsys max
1.0
0.5
Unit
kHz
MHz
MHz
MHz
ms
MHz
MHz
%
NOTES:
1. The base configuration of the MC68HC16Z1, MC68CK16Z1, MC68HC16Z4, and the MC68CK16Z4 requires
a 32.768 kHz crystal reference. The base configuration of the MC68CM16Z1, M68HC16Z2, and the
MC68HC16Z3 requires a 4.194 MHz crystal reference.
2. All internal registers retain data at 0 Hz.
3. Assumes that VDDSYN and VDD are stable, that an external filter is attached to the XFC pin, and that the crystal
oscillator is stable.
4. Assumes that VDDSYN is stable, that an external filter is attached to the XFC pin, and that the crystal oscillator
is stable, followed by VDD ramp-up. Lock time is measured from VDD at specified minimum to RESET negated.
5. Cold start is measured from VDDSYN and VDD at specified minimum to RESET negated.
6. Internal VCO frequency (fVCO) is determined by SYNCR W and Y bit values. The SYNCR X bit controls a di-
vide-by-two circuit that is not in the synthesizer feedback loop.
When X = 0, the divider is enabled, and fsys = fVCO ÷ 4.
When X = 1, the divider is disabled, and fsys = fVCO ÷ 2.
X must equal one when operating at maximum specified fsys.
7. This parameter is periodically sampled rather than 100% tested.
8. Assumes that a low-leakage external filter network is used to condition clock synthesizer input voltage. Total
external resistance from the XFC pin due to external leakage must be greater than 15 MΩ to guarantee this
specification. Filter network geometry can vary depending upon operating environment.
9. Proper layout procedures must be followed to achieve specifications.
10. Jitter is the average deviation from the programmed frequency measured over the specified interval at maxi-
mum fsys. Measurements are made with the device powered by filtered supplies and clocked by a stable exter-
nal clock signal. Noise injected into the PLL circuitry via VDDSYN and VSS and variation in crystal oscillator
frequency increase the Jclk percentage for a given interval. When jitter is a critical constraint on control system
operation, this parameter should be measured during functional testing of the final system.
M68HC16 Z SERIES
ELECTRICAL CHARACTERISTICS
USER’S MANUAL
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