MC9S08QG8 Datasheet, PDF (279/300 Pages) Freescale Semiconductor, Inc – 8-BIT HCS08 Central Processor Unit

Appendix A Electrical Characteristics
Parameter
Table A-16. Conducted Susceptibility, EFT/B
Symbol
Conditions
f_OSC/f_BUS
Result
Amplitude¹
(Min)
Unit
A
TBD
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V_{CS_EFT}
V_DD = 3.3V
T_A = +25^oC
package type
TBD
TBD crystal
TBD bus
B
C
TBD
kV
TBD
D
TBD
1 _{Data based on qualification test results. Not tested in production.}
The susceptibility performance classification is described in Table A-17.
Table A-17. Susceptibility Performance Classification
Result
A
B
Performance Criteria
No failure
The MCU performs as designed during and after exposure.
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E
Damage
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 1.01
Freescale Semiconductor
279