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MC9S08QG8 Datasheet, PDF (276/300 Pages) Freescale Semiconductor, Inc – 8-BIT HCS08 Central Processor Unit
Appendix A Electrical Characteristics
Table A-13. 3 Volt 10-bit ADC Characteristics (continued)
Characteristic
Conditions
Symb
Min
Typ1
Max
Unit
Comment
Conversion time
(including sample
time)
Sample time
Short sample (ADLSMP=0)
Long sample (ADLSMP=1)
Short sample (ADLSMP=0)
Long sample (ADLSMP=1)
tADC
tADS
—
20
—
ADCK
See
cycles Table 9-12 for
—
40
—
conversion
time variances
—
3.5
—
ADCK
cycles
—
23.5
—
Total unadjusted error 10 bit mode
8 bit mode
ETUE
—
±1.5
±3.5
LSB2
Includes
quantization
—
±0.7
±1.5
Differential
non-linearity
10 bit mode
8 bit mode
Integral non-linearity 10 bit mode
DNL
INL
—
±0.5
±1.0
LSB2 Monotonicity
—
±0.3
±0.5
and no
missing codes
guaranteed
—
±0.5
±1.0
LSB2
Zero-scale error
Full-scale error
Quantization error
Input leakage error
8 bit mode
10 bit mode
8 bit mode
10 bit mode
8 bit mode
10 bit mode
8 bit mode
10 bit mode
8 bit mode
—
±0.3
±0.5
EZS
—
±1.5
±2.1
LSB2
VADIN = VSS
—
±0.5
±0.7
EFS
0
±1.0
±1.5
LSB2
VADIN = VDD
0
±0.5
±0.5
EQ
—
—
±0.5
LSB2
—
—
±0.5
EIL
0
±0.2
±4
LSB2 Pad leakage3 *
0
±0.1
±1.2
RAS
Temp sensor
slope
-40°C– 25°C
25°C– 85°C
m
—
1.646
—
mV/°C
—
1.769
—
Temp sensor
voltage
25°C
VTEMP25
—
701.2
—
mV
1 Typical values assume VDD = 3.0 V, Temp = 25°C, fADCK = 1.0 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2 1 LSB = (VREFH - VREFL)/2N
3 Based on input pad leakage current. Refer to pad electricals.
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 1.01
276
Freescale Semiconductor