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XC5VLX110T-2FFG1738I Datasheet, PDF (37/91 Pages) Xilinx, Inc – Virtex-5 FPGA Packaging and Pinout Specification
Virtex-5 FPGA Data Sheet: DC and Switching Characteristics
I/O Standard Adjustment Measurement Methodology
Input Delay Measurements
Table 58 shows the test setup parameters used for measuring input delay.
Table 58: Input Delay Measurement Methodology
Description
I/O Standard Attribute
LVTTL (Low-Voltage Transistor-Transistor Logic) LVTTL
LVCMOS (Low-Voltage CMOS), 3.3V
LVCMOS33
LVCMOS, 2.5V
LVCMOS25
LVCMOS, 1.8V
LVCMOS18
LVCMOS, 1.5V
LVCMOS15
LVCMOS, 1.2V
LVCMOS12
PCI (Peripheral Component Interconnect),
33 MHz, 3.3V
PCI33_3
PCI, 66 MHz, 3.3V
PCI66_3
PCI-X, 133 MHz, 3.3V
PCIX
GTL (Gunning Transceiver Logic)
GTL
GTL Plus
GTLP
HSTL (High-Speed Transceiver Logic),
Class I & II
HSTL_I, HSTL_II
HSTL, Class III & IV
HSTL_III, HSTL_IV
HSTL, Class I & II, 1.8V
HSTL_I_18, HSTL_II_18
HSTL, Class III & IV, 1.8V
HSTL_III_18, HSTL_IV_18
SSTL (Stub Terminated Transceiver Logic),
Class I & II, 3.3V
SSTL3_I, SSTL3_II
SSTL, Class I & II, 2.5V
SSTL2_I, SSTL2_II
SSTL, Class I & II, 1.8V
SSTL18_I, SSTL18_II
AGP-2X/AGP (Accelerated Graphics Port)
AGP
LVDS (Low-Voltage Differential Signaling), 2.5V LVDS_25
LVDSEXT (LVDS Extended Mode), 2.5V
LVDSEXT_25
LDT (HyperTransport), 2.5V
LDT_25
LVPECL (Low-Voltage Positive Emitter-Coupled LVPECL_25
Logic), 2.5V
VL (1,2)
0
VH (1,2)
3.0
0
3.3
0
2.5
0
1.8
0
1.5
0
1.2
Per PCI™ Specification
VMEAS(1,4,5)
1.4
1.65
1.25
0.9
0.75
0.6
VREF(1,3,5)
–
–
–
–
–
–
–
Per PCI Specification
Per PCI-X™ Specification
VREF – 0.2
VREF – 0.2
VREF – 0.5
VREF + 0.2
VREF + 0.2
VREF + 0.5
VREF – 0.5
VREF – 0.5
VREF – 0.5
VREF – 1.00
VREF + 0.5
VREF + 0.5
VREF + 0.5
VREF + 1.00
VREF – 0.75
VREF + 0.75
VREF – 0.5
VREF + 0.5
VREF – (0.2 xVCCO) VREF + (0.2 xVCCO)
1.2 – 0.125
1.2 + 0.125
1.2 – 0.125
1.2 + 0.125
0.6 – 0.125
0.6 + 0.125
1.15 – 0.3
1.15 – 0.3
VREF
VREF
VREF
VREF
VREF
VREF
VREF
VREF
VREF
VREF
0(6)
0(6)
0(6)
0(6)
–
–
0.80
1.0
0.75
0.90
0.90
1.08
1.5
1.25
0.90
AGP Spec
Notes:
1. The input delay measurement methodology parameters for LVDCI are the same for LVCMOS standards of the same voltage. Input delay
measurement methodology parameters for HSLVDCI are the same as for HSTL_II standards of the same voltage. Parameters for all other DCI
standards are the same for the corresponding non-DCI standards.
2. Input waveform switches between VLand VH.
3. Measurements are made at typical, minimum, and maximum VREF values. Reported delays reflect worst case of these measurements. VREF values
listed are typical.
4. Input voltage level from which measurement starts.
5. This is an input voltage reference that bears no relation to the VREF / VMEAS parameters found in IBIS models and/or noted in Figure 11.
6. The value given is the differential input voltage.
DS202 (v5.3) May 5, 2010
www.xilinx.com
Product Specification
37