4552 Datasheet, PDF (140/145 Pages) Renesas Technology Corp – SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER

4552 Group
BUILT-IN PROM VERSION
In addition to the mask ROM versions, the 4552 Group has the
One Time PROM versions whose PROMs can only be written to
and not be erased.
The built-in PROM version has functions similar to those of the
mask ROM versions, but it has PROM mode that enables writing to
built-in PROM.
Table 19 Product of built-in PROM version
Part number
PROM size
(✕ 10 bits)
M34552G8FP
8192 words
M34552G8HFP
RAM size
(✕ 4 bits)
288 words
Table 19 shows the product of built-in PROM version. Figure 61
shows the pin configurations of built-in PROM versions.
The One Time PROM version has pin-compatibility with the mask
ROM version.
Package
48P6S-A
ROM type
One Time PROM [shipped in blank]
(1) PROM mode
The 4552 Group has a PROM mode in addition to a normal opera-
tion mode. It has a function to serially input/output the command
codes, addresses, and data required for operation (e.g., read and
program) on the built-in PROM using only a few pins. This mode
can be selected by muddog entry after powering on the VDD pin.
In the PROM mode, three types of software commands (read, pro-
gram, and program verify) can be used. Clock-synchronous serial
I/O is used, beginning from the LSB (LSB first).
(2) Notes on handling
➀For the One Time PROM version shipped in blank, Renesas
corp. does not perform PROM writing test and screening in the
assembly process and following processes. In order to improve
reliability after writing, performing writing and test according to
the flow shown in Figure 60 before using is recommended (Prod-
ucts shipped in blank: PROM contents is not written in factory
when shipped).
(3) Difference between Mask ROM version and
One Time PROM version
Mask ROM version and One Time PROM version have some dif-
ference of the following characteristics within the limits of an
electrical property by difference of a manufacture process, built-
in ROM, and a layout pattern.
• a characteristic value
• a margin of operation
• the amount of noise-proof
• noise radiation, etc.,
Accordingly, be careful of them when swithcing.
Writing with PROM programmer
Screening (Leave at 150 °C for 40 hours) (Note)
Verify test with PROM programmer
Function test in target device
Note: Since the screening temperature is higher
than storage temperature, never expose the
microcomputer to 150 °C exceeding 100
hours.
Fig. 68 Flow of writing and test of the product shipped in blank
Rev.3.02 Dec 22, 2006 page 140 of 142
REJ03B0023-0302