GRJ43DR72J104KWJ1L Datasheet, PDF (99/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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0. specifications before ordering.
GJM Series Specifications and Test MGJeMthoSdesrie(1s) Specifications and Test Methods
No.
Item
Specifications
Temperature Compensating Type
1
Operating
Temperature Range
Y55 to W125D
2 Rated Voltage
See the previous pages.
3 Appearance
4 Dimensions
No defects or abnormalities
Within the specified dimensions
5 Dielectric Strength No defects or abnormalities
6
Insulation Resistance
(I.R.)
10,000MΩ min. or 500Ω · F min. (whichever is smaller)
7 Capacitance
Within the specified tolerance
8Q
30pF and over: QU1000
30pF and below: QU400W20C
C: Nominal Capacitance (pF)
Temperature
Coefficient
Within the specified tolerance (Table A)
Capacitance
9 Temperature
Characteristics ^{Capacitance Within T0.2% or T0.05pF}
Drift
(whichever is larger.)
Test Method
Reference Temperature: 25D
(2C, 3C, 4C: 20D)
The rated voltage is defined as the maximum voltage that may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V^P-P or V^O-P,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers
No failure should be observed when 300% of the rated voltage
is applied between the terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25D and 75%RH
max. and within 2 minutes of charging.
The capacitance/Q should be measured at 25D at the
frequency and voltage shown in the table.
Frequency
Voltage
1T0.1MHz
0.5 to 5Vrms
The capacitance change should be measured after 5 min. at
each specified temperature stage.
Temperature Compensating Type
The temperature coefficient is determined using the
capacitance measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5, (5C: W25 to 125D: other temp. coeffs.: W20 to 125D) the
capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as in Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
Step
1
2
3
4
5
Temperature (D)
Reference Temp. T2
Y55T3
Reference Temp. T2
125T3
Reference Temp. T2
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig. 1 using a eutectic solder. Then apply a 5N* force in parallel
with the test jig for 10T1 sec. The soldering should be done either
with an iron or using the reflow method and should be conducted
with care so that the soldering is uniform and free of defects such
as heat shock.
*2N (GJM03)
c
10
Adhesive Strength
of Termination
No removal of the terminations or other defect should occur.
Type
GJM03
GJM15
a
0.3
0.4
Fig. 1
Solder resist
Baked electrode or
copper foil
b
c
0.9
0.3
1.5
0.5
(in mm)
Continued on the following page.
97